Products for Nanotechnology
Hiden Analytical supplies industry-leading quadrupole mass spectrometers that make cutting-edge nanotechnology applications possible, from atomic scale surface analysis to ultra-precision vacuum diagnostics. Here you will find a comprehensive list of our mass spectrometry products for the determination of surface composition, contaminant analysis and for depth profiling.
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SIMS/SNMS Workstation
The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.
![HPR-60 MBMS HPR-60 MBMS](https://www.hidenanalytical.com/wp-content/uploads/2021/09/HPR60-3-stage-with-chopper-10x8-300dpi-9.png)
HPR-60 MBMS
The HPR-60 MBMS (molecular beam mass spectrometer) is optimised for the analysis of both positive (+ve) and negative (-ve) ions, as well as neutral and radicals, making it a robust solution for plasma and combustion analysis.
![XBS_300x200px](https://www.hidenanalytical.com/wp-content/uploads/2021/03/XBS_300x200px.png)
XBS
A system for multiple source monitoring in MBE deposition applications. For molecular beam analysis and deposition rate control.
![TDSLab-6 with shadows 7680x6148 TDSLab Series with shadows](https://www.hidenanalytical.com/wp-content/uploads/2024/06/TDSLab-6-with-shadows-7680x6148-1-e1718289216633.png)
TDSLab Series
Thermal Desorptions Spectrometry Systems for Advanced Materials Research.
![FIB-SIMS for Nano-Scale Materials Analysis_shutterstock_2122755359_320x200px FIB-SIMS for Nano-Scale Materials Analysis](https://www.hidenanalytical.com/wp-content/uploads/2023/04/shutterstock_2122755359_320x200px.jpg)
FIB-SIMS
High-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems.