Products for Surface Analysis
![](https://www.hidenanalytical.com/wp-content/uploads/2021/06/Compact-SIMS-2021-1.png)
Compact SIMS
The Hiden Compact SIMS (secondary ion mass spectrometry) has a low form factor and simple, user-friendly layout, with outstanding isotopic sensitivity across the entire periodic table.
![AutoSIMS no background](https://www.hidenanalytical.com/wp-content/uploads/2022/12/AutoSIMS-no-background.png)
AutoSIMS
A robust surface analysis solution for high throughput operations, the AutoSIMS can perform hundreds of processes a day without operator intervention.
![](https://www.hidenanalytical.com/wp-content/uploads/2020/08/SIMS-Workstation_680x450px.png)
SIMS/SNMS Workstation
The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.
![](https://www.hidenanalytical.com/wp-content/uploads/2020/08/ToF-qSIMS-Workstation-680x450px.png)
ToF-qSIMS Workstation
The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.
![](https://www.hidenanalytical.com/wp-content/uploads/2020/05/eqs.jpg)
EQS SIMS Analyser
With high transmission rates and an integrated 45° electrostatic sector energy analyser, the Hiden EQS (electrostatic quadrupole) is a versatile positive and negative ion SIMS detector for surface analysis applications at the nanoscale.
![MAXIM MAXIM](https://www.hidenanalytical.com/wp-content/uploads/2022/11/SIMS_sample_0012.jpg)
MAXIM
The Hiden MAXIM is a complete quadrupole mass spectrometry system with high transmission optics and a triple mass filter, supporting detailed surface composition mapping at a mass range of up to 1000 atomic mass units (AMU).
![](https://www.hidenanalytical.com/wp-content/uploads/2020/05/ig5c.jpg)
IG5C
The IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The IG5C is designed as a primary ion beam for all SIMS applications, dynamic, static and imaging.
![](https://www.hidenanalytical.com/wp-content/uploads/2020/05/ig20.jpg)
IG20
Designed primarily for oxygen compatibility, the Hiden IG20 is a high-performance electron impact ion source with a high current density for an intense spot of just 100 micrometres (µm) in diameter.
![SIMS-on-a-flange](https://www.hidenanalytical.com/wp-content/uploads/2022/03/SIMS-on-a-flange-1.png)
Modular SIMS
Add high performance SIMS capability to your surface analysis chamber.
![Hi5 Hi5](https://www.hidenanalytical.com/wp-content/uploads/2022/11/Imperial-overall_2-Hi5-7680x5760-1.png)
Custom SIMS Solutions
The modular nature of Hiden products allows us to efficiently custom design instruments for specific applications and locations.
![](https://www.hidenanalytical.com/wp-content/uploads/2021/01/XPS-for-SIMS-scaled-e1611239352478.jpg)
XPS for SIMS
A multi-technique UHV surface science system option providing for XPS, UPS, AES, SAM, ISS and LEIS installed on the Hiden SIMS Workstation.