Academic Papers

Surface Analysis

SIMS/SNMS

SIMS/SNMS

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium. 252.94 KB 42 downloads

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and...

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Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. 1.36 MB 42 downloads

Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. ...

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Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour deposition system. 1.03 MB 47 downloads

Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour...

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Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films. 4.15 MB 43 downloads

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and...

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Others

SIMS/SNMS

Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium. 252.94 KB 42 downloads

Combustion Synthesis of Triangular and Multifunctional ZnON (x # 0.15) Materials. 1.36 MB 42 downloads

Characterization of TiO2 coatings prepared by a modified electric arc-physical vapour deposition system. 1.03 MB 47 downloads

Application of Mass Resolved Ion Scattering, Secondary Ion Mass Spectrometry and Sample-Current Measurements for In Situ Depth Profiling of Thin Films. 4.15 MB 43 downloads

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